A timing analysis algorithm for circuits with level-sensitive latches
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Critical paths in circuits with level-sensitive latches
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DAC '97 Proceedings of the 34th annual Design Automation Conference
Timing model extraction of hierarchical blocks by graph reduction
Proceedings of the 39th annual Design Automation Conference
Proceedings of the 39th annual Design Automation Conference
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Timing analysis of computer hardware
IBM Journal of Research and Development
A Switch-Level Timing Verifier for Digital MOS VLSI
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Timing Analysis and Performance Improvement of MOS VLSI Designs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Timing model extraction for sequential circuits considering process variations
Proceedings of the 2009 International Conference on Computer-Aided Design
A hierarchical approach towards system level static timing verification of SoCs
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
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We present a new timing model for latch-controlled sub-systems, referred to as the advanced black box model. The proposed model considers the transparency characteristics of latches in modeling and uses only the constraints on input signals and the characteristics of output departure time to represent the timing characteristics of the latch-controlled sub-system. Thus, it can be used for the efficient timing verification of the IP-based SoC design without re-verifying the internal timings of pre-verified Intellectual Properties (IPs) at the lower level. We also present an efficient algorithm to characterize the proposed model, which enables us to perform the timing characterization and verification of the given system simultaneously. The worst-case complexity of the entire characterization process is O(PxN^2), where P and N are the numbers of primary inputs and latches in the system.