Design and optimization of low voltage high performance dual threshold CMOS circuits
DAC '98 Proceedings of the 35th annual Design Automation Conference
MTCMOS hierarchical sizing based on mutual exclusive discharge patterns
DAC '98 Proceedings of the 35th annual Design Automation Conference
Automated selective multi-threshold design for ultra-low standby applications
Proceedings of the 2002 international symposium on Low power electronics and design
Optimal Dual -VT Assignment for Low-Voltage Energy-Constrained CMOS Circuits
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Algorithms for minimizing standby power in deep submicrometer, dual-Vt CMOS circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
PATMOS'11 Proceedings of the 21st international conference on Integrated circuit and system design: power and timing modeling, optimization, and simulation
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
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Thermal gradients across the die are becoming increasingly prominent as we scale further down into the sub-nanometer regime. While temperature was never a primary concern, its non-negligible impact on delay and reliability is getting significant attention ...