Proceedings of the Conference on Design, Automation and Test in Europe
Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects
Proceedings of the Conference on Design, Automation and Test in Europe
Journal of Electronic Testing: Theory and Applications
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults
Journal of Electronic Testing: Theory and Applications
Efficient variation-aware statistical dynamic timing analysis for delay test applications
Proceedings of the Conference on Design, Automation and Test in Europe
An on-chip delay measurement technique using signature registers for small-delay defect detection
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A high-precision on-chip path delay measurement architecture
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
AC-plus scan methodology for small delay testing and characterization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test compaction for small-delay defects using an effective path selection scheme
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, power-supply noise, as well as resistive opens and shorts can potentially cause timing failures in a design, thereby leading to quality and reliability concerns. We present a test-grading technique to leverage the method of output deviations for screening small-delay defects (SDDs). A new gate-delay defect probability measure is defined to model delay variations for nanometer technologies. The proposed technique intelligently selects the best set of patterns for SDD detection from an n-detect pattern set generated using timing-unaware automatic test-pattern generation (ATPG). It offers significantly lower computational complexity and it excites a larger number of long paths compared to previously proposed timing-aware ATPG methods. We show that, for the same pattern count, the selected patterns are more effective than timing-aware ATPG for detecting small delay defects caused by resistive shorts, resistive opens, and process variations.