Efficient design-specific worst-case corner extraction for integrated circuits

Authors:
Hong Zhang;Tsung-Hao Chen;Ming-Yuan Ting;Xin Li
Affiliations:
Mentor Graphics Corporation, San Jose, CA;Mentor Graphics Corporation, San Jose, CA;Mentor Graphics Corporation, San Jose, CA;Carnegie Mellon University, Pittsburgh, PA
Venue:
Proceedings of the 46th Annual Design Automation Conference
Year:
2009

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Abstract

While statistical analysis has been considered as an important tool for nanoscale integrated circuit design, many IC designers would like to know the design-specific worst-case corners for circuit debugging and failure diagnosis. In this paper, we propose a novel algorithm to efficiently extract the worst-case corners for nanoscale ICs. Our proposed approach mathematically formulates a quadratically constrained quadratic programming (QCQP) problem for corner extraction. Next, it applies the Lagrange duality theory to convert the non-convex QCQP problem to a convex semi-definite programming (SDP) problem that is easier to solve. Our circuit example designed in a commercial CMOS process demonstrates that the proposed SDP formulation can find the worst-case corners both efficiently and robustly, while the traditional QCQP fails to achieve global convergence.