Reap what you sow: spare cells for post-silicon metal fix
Proceedings of the 2008 international symposium on Physical design
Case Study on Speed Failure Causes in a Microprocessor
IEEE Design & Test
Speedpath prediction based on learning from a small set of examples
Proceedings of the 45th annual Design Automation Conference
IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors
Proceedings of the 45th annual Design Automation Conference
Path-RO: a novel on-chip critical path delay measurement under process variations
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Path selection for monitoring unexpected systematic timing effects
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Synthesizing a representative critical path for post-silicon delay prediction
Proceedings of the 2009 international symposium on Physical design
PSTA-based branch and bound approach to the silicon speedpath isolation problem
Proceedings of the 2009 International Conference on Computer-Aided Design
Statistical Timing Analysis: From Basic Principles to State of the Art
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
E-beam lithography stencil planning and optimization with overlapped characters
Proceedings of the 2011 international symposium on Physical design
| Hi-index | 0.00 |
We study diagnosis of segments on speedpaths that fail the timing constraint at the post-silicon stage due to manufacturing variations. We propose a formal procedure that is applied after isolating the failing speedpaths which also incorporates post-silicon path-delay measurements for more accurate analysis. Our goal is to identify segments of the failing speedpaths that have a post-silicon delay larger than their estimated delays at the pre-silicon stage. We refer to such segments as "failing segments" and we rank them according to their degree of failure. Diagnosis of failing segments alleviates the problem of lack of observability inside a path. Moreover, root-cause analysis, and post-silicon tuning or repair, can be done more effectively by focusing on the failing segments. We propose an Integer Linear Programming formulation to breakdown a path into a set of non-failing segments, leaving the remaining to be likely-failing ones. Our algorithm yields a very high "diagnosis resolution" in identifying failing segments, and in ranking them.