DIVA: a reliable substrate for deep submicron microarchitecture design
Proceedings of the 32nd annual ACM/IEEE international symposium on Microarchitecture
ReVive: cost-effective architectural support for rollback recovery in shared-memory multiprocessors
ISCA '02 Proceedings of the 29th annual international symposium on Computer architecture
ISCA '02 Proceedings of the 29th annual international symposium on Computer architecture
Instruction Randomization Self Test For Processor Cores
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
FRITS " A Microprocessor Functional BIST Method
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Instruction-Based Self-Testing of Processor Cores
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores
Journal of Electronic Testing: Theory and Applications
A Mechanism for Online Diagnosis of Hard Faults in Microprocessors
Proceedings of the 38th annual IEEE/ACM International Symposium on Microarchitecture
Ultra low-cost defect protection for microprocessor pipelines
Proceedings of the 12th international conference on Architectural support for programming languages and operating systems
Speculative execution in a distributed file system
ACM Transactions on Computer Systems (TOCS)
Phoenix: Detecting and Recovering from Permanent Processor Design Bugs with Programmable Hardware
Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture
Functional Testing of Microprocessors
IEEE Transactions on Computers
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
Argus: Low-Cost, Comprehensive Error Detection in Simple Cores
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
Online design bug detection: RTL analysis, flexible mechanisms, and evaluation
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
Software-based self-testing methodology for processor cores
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Using Field-Repairable Control Logic to Correct Design Errors in Microprocessors
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common, to the point of threatening yield rates and product lifetimes. Introspective software mechanisms hold great promise to address these reliability challenges with both low cost and high coverage. To address these challenges, we have developed a novel instruction set enhancement, called Access-Control Extensions (ACE), that can access and control a microprocessor's internal state. Using ACE technology, special firmware can periodically probe the microprocessor during execution to locate run-time faults, repair design errors (even those discovered in the field), and streamline manufacturing tests.