Improved launch for higher TDF coverage with fewer test patterns

Authors:
Youhua Shi;Nozomu Togawa;Masao Yanagisawa;Tatsuo Ohtsuki
Affiliations:
School of Science and Engineering, Waseda University, Tokyo, Japan;School of Science and Engineering, Waseda University, Tokyo, Japan;School of Science and Engineering, Waseda University, Tokyo, Japan;School of Science and Engineering, Waseda University, Tokyo, Japan
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2010

Citing 11
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Abstract

Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel imllroved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global first scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.