A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals

Authors:
N. Devtaprasanna;A. Gunda;P. Krishnamurthy;S. M. Reddy;I. Pomeranz
Affiliations:
Department of ECE, University of Iowa, Iowa City, IA;LSI Logic Corp., Milpitas, CA;LSI Logic Corp., Milpitas, CA 95035;Department of ECE, University of Iowa, Iowa City, IA;School of ECE, Purdue University, West Lafayette, IN
Venue:
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Year:
2005

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Abstract

We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles.