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ISQED '03 Proceedings of the 4th International Symposium on Quality Electronic Design
Proceedings of the conference on Design, automation and test in Europe - Volume 2
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VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
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Proceedings of the 44th annual Design Automation Conference
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IEEE Design & Test
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ATS '07 Proceedings of the 16th Asian Test Symposium
Layout-aware, IR-drop tolerant transition fault pattern generation
Proceedings of the conference on Design, automation and test in Europe
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VTS '09 Proceedings of the 2009 27th IEEE VLSI Test Symposium
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The Standard Delay Format (SDF) information is very important in timing-aware simulation of VLSI designs. However, conventionally, SDF is only design-dependent, but pattern-independent, which is called static SDF in this paper. Static SDF ignores all dynamic pattern dependent parameters, such as IR drop and crosstalk. In this paper, we propose a novel pattern-dependent SDF (called dynamic SDF) generation technique, and apply it to take IR-drop effects into consideration. With the proposed IR-drop-aware SDF generation technique, we improve the accuracy of simulation, and perform diagnosis on the failed patterns to pin point the pattern-dependent IR-drop defects in our design. Experimental results demonstrate the efficiency of this method when used for transition delay fault pattern application and diagnosis.