Defect and Error Tolerance in the Presence of Massive Numbers of Defects
IEEE Design & Test
Intelligible Test Techniques to Support Error-Tolerance
ATS '04 Proceedings of the 13th Asian Test Symposium
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
Energy Aware Computing through Probabilistic Switching: A Study of Limits
IEEE Transactions on Computers
Analysis and Testing for Error Tolerant Motion Estimation
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Hardware Testing For Error Tolerant Multimedia Compression based on Linear Transforms
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Error-Tolerance and Multi-Media
IIH-MSP '06 Proceedings of the 2006 International Conference on Intelligent Information Hiding and Multimedia
Reduction of detected acceptable faults for yield improvement via error-tolerance
Proceedings of the conference on Design, automation and test in Europe
Low Voltage, Low Power VLSI Subsystems
Low Voltage, Low Power VLSI Subsystems
MACACO: modeling and analysis of circuits for approximate computing
Proceedings of the International Conference on Computer-Aided Design
Accuracy-configurable adder for approximate arithmetic designs
Proceedings of the 49th Annual Design Automation Conference
Modeling and synthesis of quality-energy optimal approximate adders
Proceedings of the International Conference on Computer-Aided Design
Substitute-and-simplify: a unified design paradigm for approximate and quality configurable circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Improving energy gains of inexact DSP hardware through reciprocative error compensation
Proceedings of the 50th Annual Design Automation Conference
On reconfiguration-oriented approximate adder design and its application
Proceedings of the International Conference on Computer-Aided Design
An energy efficient approximate adder with carry skip for error resilient neuromorphic VLSI systems
Proceedings of the International Conference on Computer-Aided Design
Approximate logic synthesis under general error magnitude and frequency constraints
Proceedings of the International Conference on Computer-Aided Design
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In modern VLSI technology, the occurrence of all kinds of errors has become inevitable. By adopting an emerging concept in VLSI design and test, error tolerance (ET), a novel error-tolerant adder (ETA) is proposed. The ETA is able to ease the strict restriction on accuracy, and at the same time achieve tremendous improvements in both the power consumption and speed performance. When compared to its conventional counterparts, the proposed ETA is able to attain more than 65% improvement in the Power-Delay Product (PDP). One important potential application of the proposed ETA is in digital signal processing systems that can tolerate certain amount of errors.