A method of delay fault test generation
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Proceedings of the 40th annual Design Automation Conference
Adapting Scan Architectures for Low Power Operation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Minimized Power Consumption For Scan-Based Bist
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques
ITC '04 Proceedings of the International Test Conference on International Test Conference
Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing
ITC '04 Proceedings of the International Test Conference on International Test Conference
IEEE Design & Test
Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells
Journal of Electronic Testing: Theory and Applications
Test Power Reduction by Blocking Scan Cell Outputs
ATS '08 Proceedings of the 2008 17th Asian Test Symposium
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
One of the methods to reduce the power dissipation during scan shifting is based on holding the state inputs to the combinational logic of a circuit constant for the duration of a scan operation. We note that this method also allows a new type of two-pattern scan-based tests to be applied. We refer to these tests as fixed-state tests. These tests have several properties that make them effective as complements to skewed-load and broadside tests, and also allows them to be computed efficiently. We discuss these properties in the context of transition faults. We describe procedures for selecting the constant vector for the state inputs during a scan operation, and for generating fixed-state tests. We present experimental results to demonstrate the transition fault coverage improvements possible with these tests.