An analysis of the multiple fault detection capabilities of single stuck-at fault test sets

Authors:
Joseph L. A. Hughes;Edward J. McCluskey
Affiliations:
Palo Alto Research Associates, Palo Alto, California;Palo Alto Research Associates, Palo Alto, California
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

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Abstract

Multiple fault detection using single stuck-at fault test sets is considered. The 74LS181 4-bit ALU is analyzed using 10 test sets varying widely in length and method of generation. The simulation results demonstrate significantly higher multiple fault coverage than anticipated by previous studies. It is shown that single stuck-at fault test sets can provide suitably high fault coverage for practical circuits with multiple outputs and reconvergent internal fanout.