Mitigating FPGA interconnect soft errors by in-place LUT inversion

  • Authors:
  • Naifeng Jing;Ju-Yueh Lee;Weifeng He;Zhigang Mao;Lei He

  • Affiliations:
  • Shanghai Jiao Tong University, Shanghai, China;University of California, Los Angeles;Shanghai Jiao Tong University, Shanghai, China;Shanghai Jiao Tong University, Shanghai, China;University of California, Los Angeles

  • Venue:
  • Proceedings of the International Conference on Computer-Aided Design
  • Year:
  • 2011

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Abstract

Modern SRAM-based FPGAs (Field Programmable Gate Arrays) use multiplexer-based unidirectional routing, and SRAM configuration cells in these multiplexers contribute to the majority of soft errors in FPGAs. In this paper, we formulate an In-Placed inVersion (IPV) on LUT (Look-Up Table) logic polarities to reduce the Soft Error Rate (SER) at chip level, and reveal a locality and NP-Hardness of the IPV problem. We then develop an exact algorithm based on the binary integer linear programming (ILP) and also a heuristic based on the simulated annealing (SA), both enabled by the locality. We report results for the 10 largest MCNC combinational benchmarks synthesized by ABC and then placed and routed by VPR. The results show that IPV obtains close to 4x chip level SER reduction on average and SA is highly effective by obtaining the same SER reduction as ILP does. A recent work IPD has the largest LUT level SER reduction of 2.7x in literature, but its chip level SER reduction is merely 7% due to the dominance of interconnects. In contrast, SA-based IPV obtains nearly 4x chip level SER reduction and runs 30x faster. Furthermore, combining IPV and IPD leads to a chip level SER reduction of 5.3x. This does not change placement and routing, and does not affect design closure. To the best of our knowledge, our work is the first in-depth study on SER reduction for modern multiplexer-based FPGA routing by in-placed logic re-synthesis.