On-chip decoupling capacitor optimization using architectural level prediction
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Optimal planning for mesh-based power distribution
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
P/G Pad Placement Optimization: Problem Forumulation for Best IR Drop
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Fast flip-chip power grid analysis via locality and grid shells
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Efficient Design and Analysis of Robust Power Distribution Meshes
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
VLSI on-chip power/ground network optimization considering decap leakage currents
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Understanding voltage variations in chip multiprocessors using a distributed power-delivery network
Proceedings of the conference on Design, automation and test in Europe
Power Grid Physics and Implications for CAD
IEEE Design & Test
Fast Placement Optimization of Power Supply Pads
ASP-DAC '07 Proceedings of the 2007 Asia and South Pacific Design Automation Conference
Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
Package routability- and IR-drop-aware finger/pad assignment in chip-package co-design
Proceedings of the Conference on Design, Automation and Test in Europe
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A compact IR-drop model for on-chip power distribution networks in array and wire-bonded ICs is analyzed. Chip dimensions, size, and location of the supply pads, metal coverage, piecewise distribution of IC consumption, and the resistance between the pads and the power supply are considered to obtain closed-form expressions for the IR-drop. The IR-drop model is validated by comparing its results with electrical simulations. The obtained error is in the range of 1%.