Logic testing and design for testability
Logic testing and design for testability
EST: The new frontier in automatic test-pattern generation
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
COMPACTEST: A Method to Generate Compact Test Sets for Combinatorial Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A Small Test Generator for Large Designs
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Bit parallel test pattern generation for path delay faults
EDTC '95 Proceedings of the 1995 European conference on Design and Test
PODEM-X: An automatic test generation system for VLSI logic structures
DAC '81 Proceedings of the 18th Design Automation Conference
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
SAT based ATPG using fast justification and propagation in the implication graph
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
A Fault-Independent Transitive Closure Algorithm for Redundancy Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
STAR-ATPG: A High Speed Test Pattern Generator for Large Scan Designs
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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