Minimizing sensitivity to delay variations in high-performance synchronous circuits

  • Authors:
  • Xun Liu;Marios C. Papaefthymiou;Eby G. Friedman

  • Affiliations:
  • Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI;Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI;Department of Electrical Engineering, University of Rochester, Rochester, NY

  • Venue:
  • DATE '99 Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 1999

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Abstract