VIPER: an efficient vigorously sensitizable path extractor
DAC '93 Proceedings of the 30th international Design Automation Conference
The kernel, the bargaining set and the reduced game
International Journal of Game Theory
Line coverage of path delay faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on the 11th international symposium on system-level synthesis and design (ISSS'98)
High volume microprocessor test escapes, an analysis of defects our tests are missing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On Invalidation Mechanisms for Non-Robust Delay Tests
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Deception by Design: Fooling Ourselves with Gate-level Models
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Accounting for electrical phenomena in delay fault testing
Accounting for electrical phenomena in delay fault testing
Defect-Based Delay Testing of Resistive Vias-Contacts A Critical Evaluation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Effects of Multi-cycle Sensitization on Delay Tests
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
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This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMOS open defects is made possible by a new delay fault model which combines the advantages of the gate delay fault model and the path delay fault model. We develop a test generation methodology for this fault model which enables generation of test vectors that test a percentage of the longest sensitizable paths in the design and also test each net for spot defects through their longest sensitizable paths. Real delay values are used to determine the true critical paths in the circuit. The high degree of effectiveness of this fault model under realistic assumptions for process characteristics is first enumerated, and experimental results demonstrate the improved coverage possible with the proposed approach.