Design Method of a Class of Embedded Combinational Self-Testing Checkers for Two-Rail Codes

Authors:
Stanislaw J. Piestrak
Affiliations:
Wroclaw Univ. of Technology, Worclaw, Poland
Venue:
IEEE Transactions on Computers - Special issue on fault-tolerant embedded systems
Year:
2002

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Abstract

This paper tackles the open problem of designing combinational self-testing checkers (STCs) for K-pair 2-rail codes which are self-testing, even by a subset of codewords, such that some input lines are 0 (or 1) for only one input codeword. The checker presented here has both theoretical and practical importance. It is useful, e.g., to build STCs for other systematic error detecting codes like Berger codes with I=2k-1 data bits and arithmetic codes with the check base A=2k-1+1, K=3, 4, 5,....It also allows the designers to build functional totally self-checking circuits with 100 percent fault coverage in which such 2-rail codes could not have been used otherwise.