Collection and Analysis of Microprocessor Design Errors

Authors:
David Van Campenhout;Trevor Mudge;John P. Hayes
Affiliations:
-;-;-
Venue:
IEEE Design & Test
Year:
2000

Citing 4
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Abstract

Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort.