High-Level Controllability and Observability Analysis for Test Synthesis
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Testability Enhancement for Control-Flow Intensive Behaviors
Journal of Electronic Testing: Theory and Applications
BISTing Datapaths under Heterogeneous Test Schemes
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams
Proceedings of the 37th Annual Design Automation Conference
Integrated test of interacting controllers and datapaths
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Structural Fault Testing of Embedded Cores Using Pipelining
Journal of Electronic Testing: Theory and Applications
Structural BIST Insertion Using Behavioral Test Analysis
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Random pattern testability of memory control logic
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
1.3 Parallelism in Structural Fault Testing of Embedded Cores
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Efficient Test Mode Selection & Insertion for RTL-BIST
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Testability Enhancement for Behavioral Descriptions Containing Conditional Statements
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Keynote speech: testing methodologies for embedded systems and systems-on-chip
ICESS'04 Proceedings of the First international conference on Embedded Software and Systems
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A testability analysis technique for built-in self-test (BIST) at the system level is presented. While based on previous approaches, the model has several significant new features, including an iterative technique for modeling indirect feedback and an extension to the circular BIST methodology. Additionally, a new preprocessing transformation enables the correct modeling of word-level correlation. Examples validate the model, and demonstrate its applicability to test point insertion.