Testing of critical paths for delay faults

On Selecting Testable Paths in Scan Designs

Journal of Electronic Testing: Theory and Applications

Speed Binning with Path Delay Test in 150-nm Technology

IEEE Design & Test

Propagation delay fault: a new fault model to test delay faults

Proceedings of the 2005 Asia and South Pacific Design Automation Conference

On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation

Journal of Electronic Testing: Theory and Applications

Transition path delay faults: a new path delay fault model for small and large delay defects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Deterministic broadside test generation for transition path delay faults

Proceedings of the 20th symposium on Great lakes symposium on VLSI

Path selection for transition path delay faults

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

a fuzzy model for path delay fault detection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Computing two-pattern test cubes for transition path delay faults

IEEE Transactions on Very Large Scale Integration (VLSI) Systems