Modifying User-Defined Logic for Test Access to Embedded Cores

RTL Test Justification and Propagation Analysis for Modular Designs

Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis

Microprocessor based testing for core-based system on chip

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

Embedded test control schemes for compression in SOCs

Proceedings of the 39th annual Design Automation Conference

A structured test re-use methodology for core-based system chips

ITC '98 Proceedings of the 1998 IEEE International Test Conference

A novel test methodology for core-based system LSIs and a testing time minimization problem

ITC '98 Proceedings of the 1998 IEEE International Test Conference

DFT guidance through RTL test justification and propagation analysis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Testing embedded-core based system chips

ITC '98 Proceedings of the 1998 IEEE International Test Conference

4.2 Synthesis of Zero-Aliasing Elementary-Tree Space Compactors

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

Adapting Scan Architectures for Low Power Operation

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Modular and rapid testing of SOCs with unwrapped logic blocks

IEEE Transactions on Very Large Scale Integration (VLSI) Systems