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DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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Editor's note:When testing the interconnect structures on a board, test programmers sometimes ask, How can I control the test pattern generation process to avoid ground bounce problems during Extest mode? Those wishing to satisfy a simultaneously-switching-outputs constraint will find several new solutions in this article.ýMonica Lobetti-BodoniSiemens Mobile Communications