Leakage power modeling and reduction with data retention

  • Authors:
  • Weiping Liao;Joseph M. Basile;Lei He

  • Affiliations:
  • UCLA, CA;Intel Corporation, Santa Clara, CA;UCLA, CA

  • Venue:
  • Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 2002

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Abstract

In this paper, we study leakage power reduction using power gating in the forms of the Virtual power/ground Rails Clamp (VRC) and Multi-threshold CMOS (MTCMOS) techniques. We apply power gating to two circuit types: memory-based units and datapath components. Using a microarchitecture-level power simulator, as well as power and timing models derived from detailed circuit designs, we further study leakage power modeling and reduction at the system level for modern high-performance VLIW processors. We show that the leakage power can be over 40% of the total power for such processors. Moreover, we propose time-out scheduling of VRC to reduce power up to 85.65% for L2 cache. This power savings results in close to 1/3 total power dissipation for the VLIW processors we study.