Logic testing and design for testability
Logic testing and design for testability
A Data Compression Technique for Built-In Self-Test
IEEE Transactions on Computers
Journal of Electronic Testing: Theory and Applications
Programmable BIST Space Compactors
IEEE Transactions on Computers
EDCC-1 Proceedings of the First European Dependable Computing Conference on Dependable Computing
OBDD-Based Optimization of Input Probabilities for Weighted Random Pattern Generation
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Diagnosis of automata failures: a calculus and a method
IBM Journal of Research and Development
Test response compaction using multiplexed parity trees
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Shrinking wide compressors [BIST]
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DATE '00 Proceedings of the conference on Design, automation and test in Europe
A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits
WIA '99 Revised Papers from the 4th International Workshop on Automata Implementation
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
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In this paper a new structural method for linear output space compaction is presented. The method is applicable to concurrent checking and built-in self test (BIST). Based on simple estimates for the probabilities of the existence of sensitized paths from the signal lines to the circuit outputs output partitions are determined without fault simulation. For all ISCAS 85 benchmark circuits three groups of compacted outputs are sufficient to achieve 100% fault coverage in test mode and for 3 to 5 groups an error detection probability of 98% is obtained in on-line mode. The method can be applied to very large circuits.