Current Sensing Techniques for Global Interconnects in Very Deep Submicron(VDSM) CMOS

  • Authors:
  • Atul Maheshwari;Wayne Burleson

  • Affiliations:
  • -;-

  • Venue:
  • WVLSI '01 Proceedings of the IEEE Computer Society Workshop on VLSI 2001
  • Year:
  • 2001

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Abstract

Abstract: Sensing Current instead of voltage provides an alternative to signaling on the long wires that are increasingly limiting the performance of CMOS as it scales into the VDSM regime (