Efficient Verification of Hazard-Freedom in Gate-Level Timed Asynchronous Circuits

  • Authors:
  • Curtis A. Nelson;Chris J. Myers;Tomohiro Yoneda

  • Affiliations:
  • University of Utah, Salt Lake City;University of Utah, Salt Lake City;National Institute of Informatics, Tokyo, Japan

  • Venue:
  • Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 2003

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Abstract

This paper presents an efficient method for verifying hazard freedomin timed asynchronous circuits. Timed circuits are a classof asynchronous circuits that utilize explicit timing informationfor optimization throughout the entire design process. In asynchronouscircuits, correct operation requires that there are no hazardsin the circuit implementation. Therefore, when designing anasynchronous circuit, each internal node and output of the circuitmust be verified for hazard-freedom to ensure correct operation.Current verification algorithms for timed asynchronous circuits requirean explicit state exploration often resulting in state explosionfor even modest sized examples. The goal of this work isto abstract the behavior of internal nodes and utilize this informationto make a conservative determination of hazard-freedom foreach node in the circuit. Experimental results indicate that thisapproach is substantially more efficient than existing timing verificationtools. These results also indicate that this method scaleswell for large examples. It is capable of analyzing circuits in lessthan a second that could not be previously analyzed. While thismethod is conservative in that some false hazards may be reported,our results indicate that the number of false hazards is small.