New test data decompressor for low power applications
Proceedings of the 44th annual Design Automation Conference
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Scan chain clustering for test power reduction
Proceedings of the 45th annual Design Automation Conference
State skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
Proceedings of the conference on Design, automation and test in Europe
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Low-power scan operation in test compression environment
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Power supply noise reduction for at-speed scan testing in linear-decompression environment
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Defect aware X-filling for low-power scan testing
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special section on the ACM IEEE international conference on formal methods and models for codesign (MEMOCODE) 2009
Evolutionary design of reconfiguration strategies to reduce the test application time
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Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number of transitions during scan-in thereby causing high power dissipation. This paper presents a new encoding scheme that can be used in conjunction with any LFSR reseeding scheme to significantly reduce test power and even further reduce test storage. The proposed encoding scheme acts as a second stage of compression after LFSR reseeding. It accomplishes two goals. First, it reduces the number of transitions in the scan chains (by filling the unspecified bits in a different manner), and second it reduces the number of specified bits that need to be generated via LFSR reseeding. Experimental results indicate that the proposed method significantly reduces test power and in most cases provides greater test data compression than LFSR reseeding alone.