Signal-specialized parameterization for piecewise linear reconstruction

  • Authors:
  • Geetika Tewari;John Snyder;Pedro V. Sander;Steven J. Gortler;Hugues Hoppe

  • Affiliations:
  • Harvard University, Cambridge, MA;Microsoft Research, Redmond, WA;ATI Research, Marlborough, MA;Harvard University, Cambridge, MA;Microsoft Research, Redmond, WA

  • Venue:
  • Proceedings of the 2004 Eurographics/ACM SIGGRAPH symposium on Geometry processing
  • Year:
  • 2004

Quantified Score

Hi-index 0.00

Visualization

Abstract

We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.