Optimization objectives and models of variation for statistical gate sizing

Authors:
Matthew R. Guthaus;Natesan Venkateswaran;Vladimir Zolotov;Dennis Sylvester;Richard B. Brown
Affiliations:
University of Michigan, Ann Arbor, MI;IBM Microelectronics, East Fishkill, NY;IBM T.J. Watson, Yorktown Heights, NY;University of Michigan, Ann Arbor, MI;University of Utah, Salt Lake City, UT
Venue:
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Year:
2005

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Abstract

This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exclusively on the optimization algorithms without considering the effects of the variation models and objective functions. This work empirically derives a simple variation model that is then used to optimize for robustness. Optimal results from example circuits used to study the effect of the statistical objective function on parametric yield.