Test generation games from formal specifications

  • Authors:
  • Ansuman Banerjee;Bhaskar Pal;Sayantan Das;Abhijeet Kumar;Pallab Dasgupta

  • Affiliations:
  • Indian Institute of Technology,Kharagpur, West Bengal,INDIA;Indian Institute of Technology,Kharagpur, West Bengal,INDIA;Indian Institute of Technology,Kharagpur, West Bengal,INDIA;Indian Institute of Technology,Kharagpur, West Bengal,INDIA;Indian Institute of Technology,Kharagpur, West Bengal,INDIA

  • Venue:
  • Proceedings of the 43rd annual Design Automation Conference
  • Year:
  • 2006

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Abstract

In this paper, we present methods for automatic test generation from formal specifications.These are used to create intelligent test benches that are able to cover corner case behaviors in much less time.We have developed a prototype tool for intelligent test generation within the layered test bench architecture proposed in RVM.We present results on verification IPs of standard bus protocols to show the effectiveness of our approach.