Structured and tuned array generation (STAG) for high-performance random logic

  • Authors:
  • Matthew M. Ziegler;Gary S. Ditlow;Stephen V. Kosonocky;Zhenyu (Jerry) Qi;Mircea R. Stan

  • Affiliations:
  • IBM T. J. Watson Research Center, Yorktown Heights, NY;IBM T. J. Watson Research Center, Yorktown Heights, NY;IBM T. J. Watson Research Center, Yorktown Heights, NY;University of Virginia, Charlottesville, VA;University of Virginia, Charlottesville, VA

  • Venue:
  • Proceedings of the 17th ACM Great Lakes symposium on VLSI
  • Year:
  • 2007

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Abstract

Regularly structured design techniques can combat complexity on a variety of fronts. We present the Structured and Tuned Array Generation (STAG) design methodology, which provides a complete design solution from logic to layout for regularly structured circuits. The STAG circuit tuning constraints are a key component of the methodology. The tuning contraints first guide a SPICE-level tuner to a violation free region in the design space. Secondly, the tuning methodology provides flexibility for targeting a variety of design contraints and objectives. Design examples illustrate STAG's ability for fast turnaround time as well as for high performance and timing critical random logic.