Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Temperature-constrained power control for chip multiprocessors with online model estimation
Proceedings of the 36th annual international symposium on Computer architecture
ESL power analysis of embedded processors for temperature and reliability estimations
CODES+ISSS '09 Proceedings of the 7th IEEE/ACM international conference on Hardware/software codesign and system synthesis
Thermal monitoring of real processors: techniques for sensor allocation and full characterization
Proceedings of the 47th Design Automation Conference
Consistent runtime thermal prediction and control through workload phase detection
Proceedings of the 47th Design Automation Conference
Improved post-silicon power modeling using AC lock-in techniques
Proceedings of the 48th Design Automation Conference
Reliability, thermal, and power modeling and optimization
Proceedings of the International Conference on Computer-Aided Design
PowerField: a transient temperature-to-power technique based on Markov random field theory
Proceedings of the 49th Annual Design Automation Conference
Proceedings of the 49th Annual Design Automation Conference
Quantifying the impact of dynamic memory managers into memory-intensive applications
Proceedings of the 2011 Summer Computer Simulation Conference
Thermal prediction and adaptive control through workload phase detection
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on adaptive power management for energy and temperature-aware computing systems
Sensing nanosecond-scale voltage attacks and natural transients in FPGAs
Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays
Analog Integrated Circuits and Signal Processing
On the Simulation of HCI-Induced Variations of IC Timings at High Level
Journal of Electronic Testing: Theory and Applications
Runtime resource allocation for software pipelines
Proceedings of the 16th International Workshop on Software and Compilers for Embedded Systems
Temperature-aware idle time distribution for leakage energy optimization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Statistical thermal modeling and optimization considering leakage power variations
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
| Hi-index | 0.00 |
Power is the source of the greatest problems facing microprocessor designers. Rapid power variation brings transient errors. High power densities bring high temperatures, harming reliability and increasing leakage power. The wages of power are bulky, short-lived batteries, huge heat sinks, large on-die capacitors, high server electric bills, and unreliable microprocessors. Optimizing power depends on accurate and efficient modeling that spans different disciplines and levels, from device physics, to numerical methods, to microarchitectural design.