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Digital integrated circuits: a design perspective
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A design approach for radiation-hard digital electronics
Proceedings of the 43rd annual Design Automation Conference
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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A radiation tolerant phase locked loop design for digital electronics
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Proceedings of the Conference on Design, Automation and Test in Europe
SEU tolerant robust latch design
VDAT'12 Proceedings of the 16th international conference on Progress in VLSI Design and Test
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In this paper, we present a radiation-hardened digital design approach. This approach is based on the use of Code Word State Preserving (CWSP) elements at each flip-flop of the design, and leaving the rest of the design unaltered. The CWSP element provides 100% SET protection for glitch widths up to min{Dmin/2, (Dmax --- Δ)/2}, where Dmin and Dmax are the minimum and maximum circuit delay respectively and Δ is an extra delay associated with our SET protection circuit. The CWSP circuit has two inputs - the latch output signal and the same signal delayed by a quantity δ. In case an SET error is detected, then the current computation is repeated, using the correct output, which is generated later in the same clock period by the CWSP element. Unlike previous approaches, we use the CWSP element in a secondary path and the CWSP logic is designed to minimally impact the critical delay path of the design. The delay penalty of our approach (averaged over several designs) is less than 1%. Thus our technique is applicable for high-speed designs, where the additional delay associated with SET protection must be kept at a minimum.