Statistical delay fault coverage and defect level for delay faults

Authors:
E. S. Park;M. R. Mercer;T. W. Williams
Affiliations:
Department of Electrical and Computer Engineering, The University of Texas, Austin, TX;Department of Electrical and Computer Engineering, The University of Texas, Austin, TX;IBM Corporation, Boulder, CO
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

This paper presents a quantitative delay fault coverage model to provide a figure of merit for delay testing. System sensitivity of a path to a delay fault along that path and the effectiveness of a delay test are described in terms of the propagation delay of the path under test and the delay defect size. A new statistical delay fault coverage (SDFC) model is established. A new defect level model is also proposed as a function of the yield of a manufacturing process and the new statistical delay fault coverage.