Enabling system-level modeling of variation-induced faults in networks-on-chips

  • Authors:
  • Konstantinos Aisopos;Chia-Hsin Owen Chen;Li-Shiuan Peh

  • Affiliations:
  • Princeton University and Massachusetts Institute of Technology;Massachusetts Institute of Technology;Massachusetts Institute of Technology

  • Venue:
  • Proceedings of the 48th Design Automation Conference
  • Year:
  • 2011

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Abstract

Process Variation (PV) is increasingly threatening the reliability of Networks-on-Chips. Thus, various resilient router designs have been recently proposed and evaluated. However, these evaluations assume random fault distributions, which result in 52%--81% inaccuracy. We propose an accurate circuit-level fault-modeling tool, which can be plugged into any system-level NoC simulator, quantify the system-level impact of PV-induced faults at runtime, pinpoint fault-prone router components that should be protected, and accurately evaluate alternative resilient multi-core designs.