Fundamentals of modern VLSI devices
Fundamentals of modern VLSI devices
Architecture and CAD for Deep-Submicron FPGAs
Architecture and CAD for Deep-Submicron FPGAs
Reducing leakage energy in FPGAs using region-constrained placement
FPGA '04 Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays
FPGA power reduction using configurable dual-Vdd
Proceedings of the 41st annual Design Automation Conference
Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
A statistical framework for post-silicon tuning through body bias clustering
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Cross Layer Error Exploitation for Aggressive Voltage Scaling
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Fault tolerant placement and defect reconfiguration for nano-FPGAs
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Variation-aware placement for FPGAs with multi-cycle statistical timing analysis
Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays
Reliability- and process variation-aware placement for FPGAs
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A 90-nm Low-Power FPGA for Battery-Powered Applications
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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With advances in technology scaling, the configuration memory in SRAM-based FPGA is contributing a large portion of power consumption. Voltage scaling has been widely used to address the increases in power consumption in submicron regimes. However, with the advent of process variation in the configuration SRAMs, voltage scaling can undermine the integrity of a design implemented on the FPGA device as the design's functionality is determined by the contents of the configuration SRAMs. In this paper, we propose to exploit the abundance of homogenous resources on FPGA, in order to realize voltage scaling in the presence of process variation. Depending on the design to be implemented on FPGA, we select the minimal voltage that sustains a reliable placement. We then introduce a novel 2-phase placement algorithm that maximizes the reliability of the implemented design when voltage scaling is applied to the configuration memory. In the first phase, pre-deployment placement, we maximize the reliability of the implemented designs considering the a priori distribution of SRAM failures due to process variation and voltage scaling. The second phase, post-deployment placement, is performed once the device is fabricated in order to determine a fault-free placement of the design for the FPGA device. Our results indicate significant leakage power reduction (more than 50%) in the configuration memory when our placement technique is combined with voltage scaling with little delay degradation.