On Static Test Compaction and Test Pattern Ordering for Scan Designs
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Test vector decomposition-based static compaction algorithms for combinational circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On test generation for transition faults with minimized peak power dissipation
Proceedings of the 41st annual Design Automation Conference
Proceedings of the 41st annual Design Automation Conference
Test compaction for transition faults under transparent-scan
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Test vector chains for increased targeted and untargeted fault coverage
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Dynamic test compaction for a random test generation procedure with input cube avoidance
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Forward-looking reverse order fault simulation for n-detection test sets
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On test generation with test vector improvement
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On reset based functional broadside tests
Proceedings of the Conference on Design, Automation and Test in Europe
Random test generation with input cube avoidance
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths
Proceedings of the Conference on Design, Automation and Test in Europe
Test compaction techniques for assertion-based test generation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Low-power test sets under test-related primary input constraints
International Journal of Critical Computer-Based Systems
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Fault simulation of a test set in an order different from the order of generation (e.g., reverse- or random-order fault simulation) is used as a fast and effective method to drop unnecessary tests from a test set in order to reduce its size. We propose an improvement to this type of fault simulation process that makes it even more effective in reducing the test-set size. The proposed improvement allows us to drop tests without simulating them based on the fact that the faults they detect will be detected by tests that will be simulated later, hence the name of the improved procedure: forward-looking fault simulation. We present experimental results to demonstrate the effectiveness of the proposed improvement