Using BDDs and ZBDDs for Efficient Identification of Testable Path Delay Faults
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Low power ATPG for path delay faults
Proceedings of the 14th ACM Great Lakes symposium on VLSI
A new test pattern generator for high defect coverage in a BIST environment
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Implicit deductive fault simulation for complex delay fault models
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Implicit and Exact Path Delay Fault Grading in Sequential Circuits
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Low power test generation for path delay faults using stability functions
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Towards finding path delay fault tests with high test efficiency using ZBDDs
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Implicit grading of multiple path delay faults
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation
Journal of Electronic Testing: Theory and Applications
Techniques to prioritize paths for diagnosis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Function-based compact test pattern generation for path delay faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits
Journal of Electronic Testing: Theory and Applications
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We formulate the path delay fault (PDF) coverage problem as a combinatorial problem that amounts to storing and manipulating sets using a special type of binary decision diagrams, called zero-suppressed binary decision diagrams (ZBDD). The ZBDD is a canonical data structure inherently having the property of representing combinational sets very compactly. A simple modification of the proposed basic scheme allows us to increase significantly the storage capability of the data structure with minimal loss in the fault coverage accuracy. Experimental results on the ISCAS85 benchmarks show considerable improvement over all existing techniques for exact PDF grading. The proposed methodology is simple, it consists of a polynomial number of increasingly efficient ZBDD-based operations, and can handle very large test sets that grade very large number of faults.