Testable path delay fault cover for sequential circuits

The Multiple Observation Time Test Strategy

IEEE Transactions on Computers - Special issue on fault-tolerant computing

Fast identification of robust dependent path delay faults

DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference

Simulation-Based Engineering for Industrial Competitive Advantage

IEEE Design & Test

Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests

Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test

Delay Testing for Non-Robust Untestable Circuits

Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them

Identifying Redundant Path Delay Faults in Sequential Circuits

VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication

Delay fault coverage, test set size, and performance trade-offs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Energy models for delay testing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Combinational ATPG theorems for identifying untestable faults in sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems