Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Synthesized Transparent BIST for Detecting Scrambled Pattern-Sensitive Faults in RAMs
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Novel Built-In Self-Repair Approach for Embedded RAMs
Journal of Electronic Testing: Theory and Applications
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Self Test Architecture for Testing Complex Memory Structures
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Built-In Self-Test for GHz Embbedded SRAMS Using Flexible Pattern Generator And New Repair Algorithm
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Industrial Evaluation of Stress Combinations for March Tests applied to SRAMs
ITC '99 Proceedings of the 1999 IEEE International Test Conference
BIST design optimization for large-scale embedded memory cores
Proceedings of the 2009 International Conference on Computer-Aided Design
FPGA implementation of microcode-based and FSM-based memory built-in self test controllers
ACST '08 Proceedings of the Fourth IASTED International Conference on Advances in Computer Science and Technology
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