A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters

Authors:
Sybille Hellebrand;Hua-Guo Liang;Hans-Joachim Wunderlich
Affiliations:
Institute of Computer Science, University of Innsbruck, Innsbruck, Austria. sybille.hellebrand@uibk.ac.at;Division of Computer Architecture, University of Stuttgart, Stuttgart, Germany. huaguolg@informatik.uni-stuttgart.de;Division of Computer Architecture, University of Stuttgart, Stuttgart, Germany. wu@informatik.uni-stuttgart.de
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2001

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Abstract

In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson counter and is called folding counter. Both the theoretical background and practical algorithms are presented to characterize a set of deterministic test cubes by a reasonably small number of seeds for a folding counter. Combined with classical approaches for test width compression and with pseudo-random pattern generation these new techniques provide an efficient and flexible solution for scan-based BIST. Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFSRs or Johnson counters.