Constant propagation with conditional branches
ACM Transactions on Programming Languages and Systems (TOPLAS)
Efficiently computing static single assignment form and the control dependence graph
ACM Transactions on Programming Languages and Systems (TOPLAS)
Behavioral synthesis of highly testable data paths under the non-scan and partial scan environments
DAC '93 Proceedings of the 30th international Design Automation Conference
An exact algorithm for selecting partial scan flip-flops
DAC '94 Proceedings of the 31st annual Design Automation Conference
Accurate static branch prediction by value range propagation
PLDI '95 Proceedings of the ACM SIGPLAN 1995 conference on Programming language design and implementation
Testability-based partial scan analysis
Journal of Electronic Testing: Theory and Applications - Special issue on partial scan methods
Enhancing high-level control-flow for improved testability
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Array SSA form and its use in parallelization
POPL '98 Proceedings of the 25th ACM SIGPLAN-SIGACT symposium on Principles of programming languages
Formal Value-Range and Variable Testability Techniquesfor High-Level Design-For-Testability
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis
ICCD '95 Proceedings of the 1995 International Conference on Computer Design: VLSI in Computers and Processors
Testability Enhancement for Behavioral Descriptions Containing Conditional Statements
Proceedings of the IEEE International Test Conference
Formal operator testability methods for behavioral-level DFT using value ranges
HLDVT '00 Proceedings of the IEEE International High-Level Validation and Test Workshop (HLDVT'00)
Partial Scan Selection Based on Dynamic Reachability and Observability Information
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
Validation Vector Grade (VVG): A New Coverage Metric for Validation and Test
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Arithmetic built-in self test for high-level synthesis
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
High-level testability analysis and enhancement for digital systems
High-level testability analysis and enhancement for digital systems
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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Anti-random testing has proved useful in a series of empirical evaluations. The basic premise of anti-random testing is to chose new test vectors that are as far away from existing test inputs as possible. The distance measure is either Hamming distance ...