Software accelerated functional fault simulation for data-path architectures
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
A controller-based design-for-testability technique for controller-data path circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
On testable multipliers for fixed-width data path architectures
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
High-level synthesis for testability: a survey and perspective
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Design of Testable Multipliers for Fixed-Width Data Paths
IEEE Transactions on Computers
BIST Pattern Generators Using Addition and Subtraction Operations
Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis
A BIST scheme for RTL controller-data paths based on symbolic testability analysis
DAC '98 Proceedings of the 35th annual Design Automation Conference
Mixed-Mode BIST Using Embedded Processors
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Design for Testability Techniques at the Behavioraland Register-Transfer Levels
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Synthesis of Native Mode Self-Test Programs
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Allocation Techniques for Reducing BIST Area Overhead ofData Paths
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Versatile BIST: An Integrated Approach to On-line/Off-line BIST for Data-Dominated Architectures
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Estimation of BIST Resources During High-Level Synthesis
Journal of Electronic Testing: Theory and Applications
BISTing Datapaths under Heterogeneous Test Schemes
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Formal Value-Range and Variable Testability Techniquesfor High-Level Design-For-Testability
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
A novel reseeding technique for accumulator-based test pattern generation
GLSVLSI '01 Proceedings of the 11th Great Lakes symposium on VLSI
Testing Schemes for FIR Filter Structures
IEEE Transactions on Computers
On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST
Journal of Electronic Testing: Theory and Applications
Behavioral-Level DFT via Formal Operator Testability Measures
Journal of Electronic Testing: Theory and Applications
Versatile BIST: an integrated approach to on-line/off-line BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
TAO-BIST: A Framework for Testability Analysis and Optimizationb of RTL Circuits for BIST
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Effective BIST Scheme for Arithmetic Logic Un i t s
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Parameterizable Testing Scheme for FIR Filters
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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Abstract: In this paper, we propose an entirely new Built-in Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to generate test vectors and compact test responses. The paper employs state coverage to evaluate testability in an abstract level, and subsequently, use it to guide the synthesis of testable circuits.