Testing for Resistive Opens and Stuck Opens
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Delay Defect Characteristics and Testing Strategies
IEEE Design & Test
Delay Defect Screening using Process Monitor Structures
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
ELF-Murphy Data on Defects and Test Sets
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
A Measure of Quality for n-Detection Test Sets
IEEE Transactions on Computers
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Response compaction with any number of unknowns using a new LFSR architecture
Proceedings of the 42nd annual Design Automation Conference
N-detection under transparent-scan
Proceedings of the 42nd annual Design Automation Conference
Autonomic Microprocessor Execution via Self-Repairing Arrays
IEEE Transactions on Dependable and Secure Computing
Generation of broadside transition fault test sets that detect four-way bridging faults
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Forming N-detection test sets without test generation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Ramp Voltage Testing for Detecting Interconnect Open Faults
IEICE - Transactions on Information and Systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
GPU-based n-detect transition fault ATPG
Proceedings of the 50th Annual Design Automation Conference
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