Delay Defect Screening using Process Monitor Structures

Authors:
Subhasish Mitra;Erik Volkerink;Edward J. McCluskey;Stefan Eichenberger
Affiliations:
-;-;-;-
Venue:
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Year:
2004

Citing 6
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Abstract

This paper presents delay test data collected from testchips fabricated in a 0.18驴 technology.The experimentaldata shows that process monitor structures such as on-chipring oscillators are effective in identifying slow partswhile performing transition fault testing at frequenciesslower than the rated frequency.