Accumulator-based BIST approach for stuck-open and delay fault testing

Authors:
I. Voyiatzis;A. Paschalis;D. Nikolos;C. Halatsis
Affiliations:
Institute of lnformatics and Telecom., NCSR 'DEMOKRITOS', 15310. Aghia Paraskevi, Athens, GREECE;Institute of lnformatics and Telecom., NCSR 'DEMOKRITOS', 15310. Aghia Paraskevi, Athens, GREECE;Department of Computer Engineering and Informatics, University of Patras, 26500, Patra, GREECE;Department of Informatics, University of Athens, TYPA Buildings, 15771, GREECE
Venue:
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Year:
1995

Citing 2
Cited 7

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Abstract

In this paper a novel accumulator-based Built-In Self Test (BIST) method for complete two-pattern test generation is presented. Complete two-pattern testing has been proposed for stuck-open and delay testing. The proposed scheme is very attractive for a wide range of circuits based on data-path architectures with arithmetic units, or with accumulators containing binary adders. Our method generates all 2/sup n/(2/sup n/-1) distinct two-pattern pairs for a n-input circuit under test within 2/sup n/(2/sup n/-1) clock cycles. The proposed method can be easily modified to generate complete two-pattern tests for circuits having k, (kn) inputs, within 2/sup k/(2/sup k/-1) clock cycles. Thus, this method is well-suited for circuits consisting of several modules with different number of inputs.