LSI components modelling in a three-valued functional simulation
DAC '78 Proceedings of the 15th Design Automation Conference
The concurrent simulation of nearly identical digital networks
DAC '73 Proceedings of the 10th Design Automation Workshop
F/LOGIC - An interactive fault and logic simulator for digital circuits
DAC '76 Proceedings of the 13th Design Automation Conference
Operational features of an MOS timing simulator
DAC '75 Proceedings of the 12th Design Automation Conference
Concurrent fault simulation and functional level modeling
DAC '77 Proceedings of the 14th Design Automation Conference
Practical experiences from signal probability simulation of digital designs
DAC '77 Proceedings of the 14th Design Automation Conference
Detection of static and dynamic hazards in logic nets
DAC '77 Proceedings of the 14th Design Automation Conference
An efficient method of fault simulation for digital circuits modeled from boolean gates and memories
DAC '77 Proceedings of the 14th Design Automation Conference
A Design Verification and Logic Validation System
DAC '77 Proceedings of the 14th Design Automation Conference
Mixed-level simulation from a hierarchical CHDL
ACM SIGDA Newsletter
Hierarchical design verification for large digital systems
DAC '81 Proceedings of the 18th Design Automation Conference
A MOS/LSI oriented logic simulator
DAC '81 Proceedings of the 18th Design Automation Conference
A set of programs for MOS design
DAC '81 Proceedings of the 18th Design Automation Conference
GSP: A logic simulator for LSI
DAC '81 Proceedings of the 18th Design Automation Conference
An accurate functional level concurrent fault simulator
DAC '80 Proceedings of the 17th Design Automation Conference
High-speed concurrent fault simulation with vectors and scalars
DAC '80 Proceedings of the 17th Design Automation Conference
MIXS: A mixed level simulator for large digital system logic verification
DAC '80 Proceedings of the 17th Design Automation Conference
A functional level modelling language for digital simulation
DAC '82 Proceedings of the 19th Design Automation Conference
An Interactive Simulation System for structured logic design—ISS
DAC '82 Proceedings of the 19th Design Automation Conference
Applications of testability analysis: from ATPG to critical delay path tracing
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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Simulation, in several forms, is used extensively in present day circuit design. The various forms of simulation can be categorized in terms of level of detail offered, ranging from circuit level (transistors, capacitors, etc.) to timing level (e.g., MOTIS (1)) to logic gate level (NAND, NOR, etc.) to register transfer level. As with a microscope, increasing the resolution decreases the field of view. This 'law' imposes a constraint on the size of circuit a designer can simulate at any one level of detail, and most simulation programs are rigidly defined to operate at only one level. This leads to obvious problems, for example, when a circuit is mixed analog/digital, although some progress has been made on incorporating circuit level and gate level detail in one program(2). However, digital circuit sizes keep increasing and even now the gate level often offers too much resolution. To keep simulation costs down and to avoid overwhelming the macroscopic features of a circuit with irrelevant data another level of digital logic simulation is required. The various Hardware Description Languages(3) are too far removed from the gate level to be of much use here as they represent a very large, discrete jump from the gate level, when we would prefer a continuum of simulation resolution.