RL-huffman encoding for test compression and power reduction in scan applications
ACM Transactions on Design Automation of Electronic Systems (TODAES)
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
SOC test architecture optimization for signal integrity faults on core-external interconnects
Proceedings of the 44th annual Design Automation Conference
ACM Transactions on Design Automation of Electronic Systems (TODAES)
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
An IEEE 1149.1-based BIST method for at-speed testing of inter-switch links in network on chip
Microelectronics Journal
Built-in sensor for signal integrity faults in digital interconnect signals
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Complement routing: A methodology to design reliable routing algorithm for Network on Chips
Microprocessors & Microsystems
A reliable and power efficient flow-control method to eliminate crosstalk faults in network-on-chips
Microprocessors & Microsystems
Journal of Electronic Testing: Theory and Applications
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As the technology is shrinking toward 50 nm and the working frequencyis going into multi gigahertz range, the effect of interconnectson functionality and performance of system-on-chips is becomingdominant. More specifically, distortion (integrity loss) of signalstraveling on high-speed interconnects can no longer be ignored. Inthis paper, we extend the conventional boundary scan architectureto allow testing signal integrity in SoC interconnects. Our extendedJTAG architecture collects and outputs the integrity loss informationusing the enhanced observation cells. The architecture fully complieswith the JTAG standard and can be adopted by any SoC that is IEEE1149.1 compliant. We also propose a simple yet efficient compressionscheme that can be employed by an ATE to minimize the scan-indelivery time.