Low-power encodings for global communication in CMOS VLSI
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on low power electronics and design
Getting to the bottom of deep submicron II: a global wiring paradigm
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Analysis and implementation of charge recycling for deep sub-micron buses
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Temperature-Aware Delay Borrowing for Energy-Efficient Low-Voltage Link Design
NOCS '10 Proceedings of the 2010 Fourth ACM/IEEE International Symposium on Networks-on-Chip
Repeater insertion in power-managed VLSI systems
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
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On-chip buses are typically designed to meet performance constraints at worst-case conditions, including process corner, temperature, IR-drop, and neighboring net switching pattern. This can result in significant performance slack at more typical operating conditions. In this paper, we propose a dynamic voltage scaling (DVS) technique for buses, based on a double sampling latch which can detect and correct for delay errors without the need for retransmission. The proposed approach recovers the available slack at non-worst-case operating points through more aggressive voltage scaling and tracks changing conditions by monitoring the error recovery rate. Voltage margins needed in traditional designs to accommodate worst-case performance conditions are therefore eliminated, resulting in a significant improvement in energy efficiency. The approach was implemented for a 6mm memory read bus operating at 1.5GHz (0.13 µm technology node) and was simulated for a number of benchmark programs. Even at the worst-case process and environment conditions, energy gains of up to 17% are achieved, with error recovery rates under 2.3%. At more typical process and environment conditions, energy gains range from 35% to 45%, with a performance degradation under 2%. An analysis of optimum interconnect architectures for maximizing energy gains with this approach shows that the proposed approach performs well with technology scaling.